Wimos [Internet News and Bussines]

Advantest Corp has introduced the T5782, a memory tester designed with pre-site architecture and speeds of 266MHz/533Mbps. The device is engineered for testing Flash memories, as well as future device generations including memory-embedded MCUs and rapidly evolving memory bus environments.

The T5782’s at-speed, at-specification performance is claimed will meet the requirements of tomorrow’s known good die (KGD) and multi chip package (MCP) memory solutions.

The system has the ability to simultaneously test up to 256 devices and inherits the advanced technologies and performance features of its predecessor, the T5781, with a footprint half the size. The T5782 also incorporates many Flash functions including ECC and block management, which enable the system to flexibly address diversified needs.

Targeting the memory circuits of Flash MCUs, the T5782 offers test speed of 266MHz, said to be the fastest speed in the industry. Parallel test capacity has been reduced by 50% compared to the previous model, the T5781, which optimizes the tester’s configuration to support rapid generational progress in the Flash MCU segment, and allows for savings on specialized consumable fixturing costs and power consumption. Low running costs facilitate cost-effective Flash MCU production.

The T5782 offers Flash memory and DRAM test capabilities, enabling MCP test in addition to Flash memory wafer and package test.